The Materials Characterization and Metrology Center [MC]² at at San José State University provides a wide variety of materials imaging and chemical analysis capabilities for numerous applications throughout science and engineering.

The Center serves students, faculty, industry collaborators, and educational outreach partners at SJSU and across Silicon Valley.  Instruments are distributed in laboratories across the campus, and shared among users of the Center.

Fall 2009 Training Courses (click for details):

MatE 143 Principles of Scanning Electron Microscopy

MatE 144 X-Ray Diffraction

MatE 145 Principles of Scanning Probe Microscopy

The Center is currently supported by a Cooperative Agreement from the Defense Microelectronics Activity.  Previous support includes a grant from the Major Research Instrumentation Program of the National Science Foundation (Award #0421562).

Annual Reports for the [MC]² are available at:

http://www.engr.sjsu.edu/mc2/oru.htm

Faculty and Student Publications are listed here:

http://www.engr.sjsu.edu/~eallen/NMDC/DMEA%20Publications%20List.pdf

San José State University  |  Materials Characterization & Metrology Center  [MC]²  |  2009 Oct 12