The SJSU Materials Characterization and Metrology Center [MC]2 provides materials imaging and chemical analysis capabilities for applications in various fields of science and engineering. Instruments are located in various buildings across campus. The purpose of the Center is to provide capabilities for students and faculty in the Colleges of Engineering and Science, to provide partnering opportunities with external users, and to encourage interactions with local community colleges and high schools.
The Center is currently supported by a grant from the Defense Microelectronics Activity (DMEA #H94003-07-2-0705) as well as a Major Research Instrumentation grant from the National Science Foundation (CTD #0421562).
For more information about the Center, contact the Center Director.
Last modified: Jan. 28, '08.